Krishan Lal, Indian physical crystallographer (Chiniot, today Pakistan 15 March 1941 –

Authored over 122 research papers, 9 books and 7 patents

Directly observed and characterized effect of external electric fields on real structure of semiconductors and insulators

Characterized the effect of processing steps for solid states devices fabrication on substrate materials

Enabled growth of single crystals of unprecedented perfection level

First to observe directly and characterize very low angle boundaries with tilt angles

Developed accurate techniques for measurement of dielectric constants and dielectric loss of single crystals 

Developed a new high-resolution technique and a three-crystal x-ray diffractometer to investigate diffuse x-ray scattering from nearly perfect single crystal

Developed high quality multi-crystal x-ray diffractometers